• Film Thickness Measuring instrument   FTM-20
  • Film Thickness Measuring instrument   FTM-20

Film Thickness Measuring instrument FTM-20

No.FTM-20

Thickness measurement systems for film thicknesses from 1 nm to 100 μm.

Whether you want to know the thickness of a film, its optical constants, or the reflectance and transmittance of a material, the FTM--20 has what you need. It takes only a few minutes to set up, connects to a PC via USB, and the device delivers results in seconds. Due to its modular design, the FTM--20 is suitable for a wide range of applications:

  • Film Thickness Measuring instrument   FTM-20
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Product Features

  • Measurement principle;
  • Non-contact measurement;
  • High accuracy;
  • Rapid Measurement;
  • Easy to operate;
  • Multi-layer film measurement capability;
  • Data analysis. 

Product Application
Measurement content:Thickness, reflectivity
Measurement condition Table-top, in-line measurement on flat or curved surfaces
Measurement target:Translucent or low absorption coefficient films
Measurement field:Semiconductor, liquid crystal, optical coating, biomedical, etc.
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